Approximation Algorithm Solution to Maximum Problem of Submodular Set Function under the Double Knapsacks Constraint and Its Performance Guarantee 求解双背包约束下下模集函数最大问题的近似算法及其性能保证
An improved greedy algorithm for maximizing a submodular set function with multiple constraints 求解多维约束下下模函数最大值的改进贪婪算法
An approximation algorithm for maximizing a non-decreasing submodular set function and its performance guarantee 最大化非减次模集函数问题的近似算法及其性能保证
A Greedy Algorithm for Maximizing Submodular Set Function under Partition Matroid Constraint 剖分拟阵约束下求解下模函数最大值问题的一种贪婪算法
By comparing the two step testing of both static and dynamic, we can realize the off line debugging of the submodular circuit board. This method has already been used in the imitation procession of the unit circuit board. 采用静态和动态两步测试比较,可以实现子模块电路板的脱机调试.该方法已在单元电路板的仿制过程中得到应用。